There are many methods to measure the surface properties by AFM, such as section analysis, grain analysis and bearing analysis. Thus, "baseline correction" in Nanoscope Analysis Software was used to achieve the correct adhesion force values. Nanoscope Analysis V1 40 Software | Bruker Corporation | Bioz.Äownload Download high-res image (216KB) Download Download full-size image Fig. Nanoscope analysis software? - ResearchGate. ![]()
0 Comments
Leave a Reply. |
AuthorWrite something about yourself. No need to be fancy, just an overview. ArchivesCategories |